Dynaray High Performance Phased Array UT – ZETEC
Zetec’s innovative DYNARAY® system completely redefines the potential of phased array UT technology by enabling highly efficient and more flexible inspection solutions. This powerful phased array UT data acquisition system can be configured with up to 256 simultaneously active channels, to fully benefit from the versatility of 2-D matrix array probes.
The DYNARAY® acquisition system offers superior inspection capabilities on rough and wavy surfaces. Owing to its raw processing power, the system can dynamically adapt focal laws sent to the phased array probe during the inspection sequence as a function of the probe position.
With capacity to generate 20 GB data files with 16-Bit amplitude resolution, the DYNARAY® acquisition system is built to meet all challenges. No inspection is too big.
The high data throughput removes any hardware speed limitations and helps you increase you scan speed, lowering the inspection time.
The new UltraVision® 3 software drives the DYNARAY® system with advanced data acquisition and analysis functions. The software offers a 3-D work environment, including the creation of components and visualization of examination data. UltraVision® 3 can also generate optimized acoustic beams through complex inspection surfaces. Any desktop or laptop PC with at least a 2-GHz processor, 2 GB of RAM and a high-speed (1 Gb/s) Ethernet link can be used to control Zetec’s DYNARAY®. Higher PC specifications may be required to fully exploit some of the advanced features. In particular, a high performance HDD is strongly recommended to keep up with the high data throughput capability.
Speed counts – The high data throughput removes any hardware speed limitations and helps you increase your scan speed, lowering the inspection time.
Features & Benefits
- 2-D Matrix Array Technology Up to 256 simultaneously active elements, and up to 512 channels in total
- Speed Counts High data throughput, up to 30 MB/s
- Wide range of probe frequencies Drives low-frequency array probes (down to 0.5 MHz)
- Flexible Inspection Setup Up to 4,096 different focal laws with Position Dependent configuration for superior inspection quality on complex surfaces
- 3-D Work Environment
Controlled by UltraVision® 3, offering 3-D work environment for creation of components and data visualization
The DYNARAY systems offer superior inspection capabilities on rough and wavy surfaces. They are built to meet all challenges. No inspection is too big. The UltraVision® 3 software drives these systems with advanced data acquisition and analysis functions.